IPS Probe Station

4~12 inch set ups. Modular design, highly cost-effective and can be upgraded as your requirements changes.

Probe stations are very expensive and durable lab equipment. Many users only have very limited budgets at the beginning but their test requirements could change over time. This will result in idle equipment and more capital costs.

IPS allows you to start with a probe station with very competitive price. You can upgrade the system easily as their test requirements change. With the modular design, you simply choose from various chuck options, microscope options and test kits. The ease of upgrade capability protects your current investment for future needs.

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Description

<5fA Leakage Current, <10fF Residual Capacitance

IPS probe station was designed with the advanced concept for ultra-low noise measurement at the beginning. IPS probe station can easily achieve the goal of <5fA leakage current and <10fF residual capacitance by using proper probes and shielding techniques.

Femto Probe and CPA-10 Coax Probe extends the guarding area to the edge of the probe tips, greatly reduce the leakage current from probe tips. EMI Shield enclosure protects the system from electrostatic and AC filed interference.

Basic I-V/C-V Measurement Set up

Key Factor’s IPS probe station can be set up with basic measurement functions if you don’t need a high precision probe station at the beginning. Our modular design allows you to upgrade our system with ease (no return and no modification).

For basic I-V/C-V measurement, you can start with our model IPS-AS-Stereo with S10 series probe holders and DTP100/DCP100 micro positioners.

RF S Parameters Measurement Set up

IPS probe station is not only for I-V/C-V measurement. You can also set it up for RF measurement of S parameters.

The basic set up of IPS-RF consists of: 1set of IPS-AS-Stereo probe station (with auxiliary chucks), 2 sets of DCP100 micro positioners, 2 sets of RFH100 probe adapters, 2 sets of M40A RF probes and accessories for up to 40GHz measurement.

The rigid and stable design of DCP10 and RFH100 assures accurate probing and stable contacts of probes to pads, thus improving test reliability.

High Power Measurement Set up

Safety is the first consideration of high-power characterizations. Our IPS-HP model is always provided with EMI Shield enclosure with interlock or safety light curtain. These configurations will protect user from electric shocking harm.

The test capability of model IPS-HP is for up to 3kV high voltage and 40A high current measurement. In order to avoid arcing at high voltage, IPS-HP is specially designed with an Anti-Arc structure.

Hot Chuck Options

Key Factors also provides hot chucks for users require thermal test conditions. The most popular set up is RT to 200℃ temperature range with 0.1℃ stability. We can also provide higher temperature range, such as RT to 300℃ or RT to 800℃.

The hot chuck system consists of a gold-plated sample holder and a temperature regulation system – TemPro. With this configuration, you can set and monitor temperature on our TemPro controller or on our TemPro software on computer.

Output power of TemPro is DC 24V that protects you from electric shock harm, keeping you safe. The DC power output also has smaller EMI to your tests than AC power temperature controllers.

Triaxial chuck options

The key to success of ultra-low noise I-V/C-V measurement is to make the probe station “invisible” to the test instrument. That means you will need to be very careful about the guarding, shielding and grounding of the probe station. Any failure of these factors will cause leakage current to surge obviously.

With our triaxial chuck, you can succeed easily in ultra-low noise measurement simply by connecting our probe station from one side to the other.

Customizable to meet your photon-electric characterizations

Key Factor can also be customized for holders or any structures for photon-electric tests. We can design these structures for your lasers, fibers and other optical parts and make them compatible with our IPS probe station.

Features

KitStart Test Packages Features
KitStart Test Packages Comprehensive solutions for your semiconductors characterizations.

  • FA Test Package, <5fA current leakage.
  • BIV Test Package, <10nA current leakage.
  • COAX Test Package, <10pA current leakage.
  • TRIAX Test Package, <100fA current leakage.
  • RF Test Package for S parameter characterizations.
Modular Design User can start with a simple set up and upgrade the system with our modular parts.
Microscope module, hot chuck module, coax/triax chuck module, etc.
Highly Cost-effective Modular design allow you to choose for the parts that are necessary, saving capital costs.
Unique chuck X-Y Standard chuck air bearing stage for fast X-Y movement.
Screws driven X-Y available upon request.

Downloads

Adobe PDF

1IPS Probe Station Technical Specs Series Datasheet

Language: English

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